Gupta, Dinesh C <br/><br/>
Recombination lifetime measurements in silicon 

 - Conshohocken  ASTM Pub.  1998 
 - 392 p.  Illustration 
 - STP 1340 .
<br/><br/><label>ISBN: </label>0803124899 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ELECTRONIC DEVICES<br/>ELECTRONIC MEASUREMENT<br/>SEMICONDUCTORS<br/>SILICON RECOMBINATION
<br/><br/><label>Universal Decimal Class. No.: </label>621.38  / REC