TY  - GEN
AU  - Kressel, Henry
TI  - Characterization of epitaxial semiconductor films
T2  - Methods and Phenomena : Their Applications and Technology, vol.2
SN  - 044441438X
U1  - 530.41 
PY  - 1976///
CY  - Amsterdam
PB  - Elsevier
KW  - PHYSICS
ER  -