TY  - GEN
AU  - Sandell, E.B
AU  - Onishi, Hiroshi
TI  - Photometric determination of traces of metals general aspects
T2  - Chemical Analysis,3
SN  - 0471030945
U1  - 546.3 
PY  - 1978///
CY  - New York
PB  - John Wiley
ER  -