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Recombination lifetime measurements in silicon

By: Contributor(s): Language: English Series: STP 1340Publication details: Conshohocken ASTM Pub. 1998 1998Description: 392 p. IllustrationISBN:
  • 0803124899
Subject(s):
Item type: Lending Books
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Item type Current library Collection Call number Status Date due Barcode Item holds
Reference Books Reference Books Engineering Library Lending Section Reference Collection 621.38 REC (Browse shelf(Opens below)) Available 208020
Lending Books Lending Books Engineering Library Lending Section Lending Collection 621.38 REC (Browse shelf(Opens below)) Available 208021
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