Recombination lifetime measurements in silicon
Language: English Series: STP 1340Publication details: Conshohocken ASTM Pub. 1998 1998Description: 392 p. IllustrationISBN:- 0803124899

Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
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Engineering Library Lending Section | Reference Collection | 621.38 REC (Browse shelf(Opens below)) | Available | 208020 | |||
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Engineering Library Lending Section | Lending Collection | 621.38 REC (Browse shelf(Opens below)) | Available | 208021 |
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