| 000 | 00552 a2200217 4500 | ||
|---|---|---|---|
| 003 | ISURu | ||
| 005 | 20240721203842.0 | ||
| 020 | _a0471030945 | ||
| 041 | _aeng | ||
| 082 |
_a546.3 _bSAN |
||
| 090 | _d60324 | ||
| 100 |
_aSandell, E.B _9129141 |
||
| 245 | _aPhotometric determination of traces of metals general aspects | ||
| 250 | _a4th ed. | ||
| 260 |
_aNew York _bJohn Wiley _c1978 _g1978 |
||
| 300 | _a[12],1085 p. | ||
| 490 | _aChemical Analysis,3 | ||
| 700 |
_aOnishi, Hiroshi _9129143 |
||
| 942 | _cPR | ||
| 999 |
_c49019 _d60324 |
||
| 945 |
_dMain Library ADMIN _c26318 |
||